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SPIE Optical Metrology 2013 |
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SPIE Optical Metrology 2013 |
Closed
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SPIE Optical Metrology Conference |
Dates:
Monday, May 13, 2013 - Thursday, May 16, 2013
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Venue: ICM Munich,
Munich,
Germany |
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SPIE Optical Metrology | The Latest Research on Measurement Systems, Modeling, Videometrics, and Inspection
SPIE Optical Metrology is the premier conference in Europe that brings together scientists, engineers, researchers, and applications or product developers engaged in all aspects of the field of optical metrology.
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Website: http://spie.org/optical-metrology.xml
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