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NSS/MIC 2019 |
Closed
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International Symposium on Rom-Temperature Semiconductor X-Ray & Gamma-Ray Detectors |
Dates:
Saturday, October 26, 2019 - Saturday, November 2, 2019
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Venue: Manchester Central Convention Complex,
Manchester,
United Kingdom |
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The IEEE NSS-MIC is the leading annual international meeting for all scientists, engineers, researchers, medical physicists and students with an interest in radiation detectors, related technologies and their applications. Exciting developments and new directions are emerging in many areas of our field so please look at the NSS, MIC and RTSD sections for the updated lists of the topics that will be covered by the meeting this year. Whilst delegates typically have a primary interest in either the NSS or the MIC, due to the synergy between the two meetings many attend sessions from both. This year's meeting will also host the 26th International Symposium on Room-Temperature X-Ray and Gamma-Ray Detectors.
The main focus of the meeting is of course the programme of oral presentation sessions covering the most innovative and topical submitted work, however the NSS-MIC traditionally also places great emphasis on the complementary programme of poster sessions, providing an excellent opportunity to discuss your work informally and in depth with other researchers in the field. Seating areas for informal discussions are situated throughout the venue.
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Website: http://www.nss-mic.org/
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