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FCMN 2019
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-2667 days
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International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN)
4/2/2019 - 4/4/2019
Venue: Monterey Marriott, Monterey CA, United States
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The FCMN will bring together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials... |
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PCSI-46 2019
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-2746 days
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46th Conference on the Physics and Chemistry of Surfaces and Interfaces (PCSI-46)
1/13/2019 - 1/17/2019
Venue: La Fonda on the Plaza, Santa Fe NM, United States
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The annual PCSI conference is devoted to achieve a fundamental understanding of the physical, chemical, biological, structural, optical, magnetic and ... |
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AVS International Symposium and Exhibition 2018
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-2830 days
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AVS 65th International Symposium & Exhibition
10/21/2018 - 10/26/2018
Venue: Long Beach Convention Center, Los Angeles CA, United States
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The AVS International Symposium and Exhibition has been developed to address cutting-edge issues associated with vacuum science and technology in both... |
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AVS International Symposium and Exhibition 2017
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-3187 days
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AVS 64th International Symposium & Exhibition
10/29/2017 - 11/3/2017
Venue: Tampa Convention Center, Tampa FL, United States
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The AVS International Symposium and Exhibition addresses cutting-edge issues associated with materials, processing, and interfaces in the research and... |
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AVS International Symposium and Exhibition 2016
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-3544 days
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63rd AVS International Symposium and Exhibition
11/6/2016 - 11/11/2016
Venue: Nashville Convention Center, Nashville TN, United States
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The AVS International Symposium and Exhibition addresses cutting-edge issues associated with materials, processing, and interfaces in the research and... |
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AVS International Symposium and Exhibition 2015
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-3929 days
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62nd AVS International Symposium and Exhibition
10/18/2015 - 10/23/2015
Venue: San Jose Convention Center, San Francisco CA, United States
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The AVS International Symposium and Exhibition addresses cutting-edge issues associated with materials, processing, and interfaces in both the researc... |
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